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.TH "NAND_VERIFY_PAGES" "9" "09 October 2005" "" ""

.SH NAME
nand_verify_pages \- [GENERIC] verify the chip contents after a write
.SH SYNOPSIS
"SYNOPSIS"
.sp
\fB
.sp
int nand_verify_pages  (struct mtd_info * \fImtd\fB, struct nand_chip * \fIthis\fB, int \fIpage\fB, int \fInumpages\fB, u_char * \fIoob_buf\fB, struct nand_oobinfo * \fIoobsel\fB, int \fIchipnr\fB, int \fIoobmode\fB);
\fR
.SH "ARGUMENTS"
.TP
\fB\fImtd\fB\fR
MTD device structure
.TP
\fB\fIthis\fB\fR
NAND chip structure
.TP
\fB\fIpage\fB\fR
startpage inside the chip, must be called with (page & this->pagemask)
.TP
\fB\fInumpages\fB\fR
number of pages to verify
.TP
\fB\fIoob_buf\fB\fR
out of band data buffer
.TP
\fB\fIoobsel\fB\fR
out of band selecttion structre
.TP
\fB\fIchipnr\fB\fR
number of the current chip
.TP
\fB\fIoobmode\fB\fR
1 = full buffer verify, 0 = ecc only
.SH "DESCRIPTION"
.PP
The NAND device assumes that it is always writing to a cleanly erased page.
Hence, it performs its internal write verification only on bits that 
transitioned from 1 to 0. The device does NOT verify the whole page on a
byte by byte basis. It is possible that the page was not completely erased 
or the page is becoming unusable due to wear. The read with ECC would catch 
the error later when the ECC page check fails, but we would rather catch 
it early in the page write stage. Better to write no data than invalid data.